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Structural characterization of germanium selenide glasses by differential anomalous X-ray scattering

✍ Scribed by P. Armand; A. Ibanez; Q. Ma; D. Raoux; E. Philippot

Book ID
115989908
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
973 KB
Volume
167
Category
Article
ISSN
0022-3093

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Anomalous X-ray scattering study of the
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## Abstract Anomalous X‐ray scattering experiments on glassy Ge~__x__~Se~1βˆ’__x__~ semiconductors have been carried out at energies close to the Ge and Se K edges in a wide concentration range from __x__ = 0.15 to 0.333 across the rigidity percolation threshold composition of __x__ = 0.20. The total