Structural characteristics of multicomponent GaAs-InxGa1-xAs system from double-crystal X-ray diffractometry data

✍ Scribed by A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; A. A. Lomov

• Book ID: 110124452
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2000
• Tongue: English
• Weight: 101 KB
• Volume: 45
• Category: Article
• ISSN: 1063-7745
• DOI: 10.1134/1.1306579