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Structural characteristics of multicomponent GaAs-InxGa1-xAs system from double-crystal X-ray diffractometry data

✍ Scribed by A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; A. A. Lomov


Book ID
110124452
Publisher
SP MAIK Nauka/Interperiodica
Year
2000
Tongue
English
Weight
101 KB
Volume
45
Category
Article
ISSN
1063-7745

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