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Structural characterisation of nickel silicide performed by two-dimensional X-ray microdiffraction

✍ Scribed by P. Colombi; E. Bontempi; U.M. Meotto; S. Porro; C. Ricciardi; L. Scaltrito; S. Ferrero; G. Richieri; L. Merlin; L.E. Depero

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 341 KB
Volume: 114-115
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2004.07.071

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