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Structural changes in helium implanted Zr0.8Y0.2O1.9 single crystals characterized by atomic force microscopy and EXAFS spectroscopy

✍ Scribed by G. Kuri; D. Gavillet; M. Döbeli; D. Novikov


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
415 KB
Volume
266
Category
Article
ISSN
0168-583X

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