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Structural and valence electronic analysis of electron-irradiation-induced foreign-atom implantation by a combination of UHVEM and AES

✍ Scribed by H. Yasuda; T. Sakata; H. Mori


Book ID
103685973
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
966 KB
Volume
39
Category
Article
ISSN
0304-3991

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