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Structural and energy characteristics of native vacancy-type defects in the biaxially stressed GaN lattice

✍ Scribed by T. V. Bez’yazychnaya; V. M. Zelenkovskii; A. L. Gurskii; G. I. Ryabtsev


Book ID
111444143
Publisher
Springer
Year
2008
Tongue
English
Weight
172 KB
Volume
42
Category
Article
ISSN
1063-7826

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