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Structural and electrical properties of 0.7Pb(Mg1/3Nb2/3)O3–0.3PbTiO3thin films grown on Ir/MgO buffered Si(100) substrates

✍ Scribed by F. Wu; X.M. Li; W.D. Yu; X.D. Gao; X. Zhang

No coin nor oath required. For personal study only.

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