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Structural and dielectric properties of Ba(X1/3Ta2/3)O3 thin films grown by RF-PLD

✍ Scribed by Nedelcu, L.; Scarisoreanu, N.D.; Chirila, C.; Busuioc, C.; Banciu, M.G.; Jinga, S.I.; Dinescu, M.

No coin nor oath required. For personal study only.

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