Strain effects on carrier lifetimes in I
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M.H. Moloney; J. Hegarty; L. Buydens; P. Demeester; R. Grey; J. Woodhead
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Article
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1993
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Elsevier Science
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English
⚖ 379 KB
Lifetimes were measured in several InGaAs/(Al)GaAs samples with various levels of strain and strain relief, with thick barriers and with GaAs barriers. Lifetimes of the order of 0.5 ns were measured. We have found that the introduction of indium, to obtain InGaAs wells, causes a dramatic decrease in