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Structural analysis of zinc phthalocyanine (ZnPc) thin films: X-ray diffraction study

โœ Scribed by Senthilarasu, S.; Hahn, Y. B.; Lee, Soo-Hyoung


Book ID
120499828
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
722 KB
Volume
102
Category
Article
ISSN
0021-8979

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Thin Film Analysis by X-Ray Scattering (
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Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr