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Structural analysis of Cu1−xAgxGaSe2 bulk materials and thin films

✍ Scribed by M.E Beck; T Weiss; D Fischer; S Fiechter; A Jäger-Waldau; M.Ch Lux-Steiner

Book ID
114086889
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
215 KB
Volume
361-362
Category
Article
ISSN
0040-6090

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## Abstract Glancing‐angle deposition (GLAD) was used in this work to grow transparent oxide Cu~2~O thin films by annealing in air at 185 °C of copper films deposited firstly by this method onto glass substrates. The annealing temperature of 185 °C corresponds to the optimal temperature that corres