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Strontium concentration dependence of the in-plane penetration depth of superconducting La2−xSrxCuO4±δ very thin films

✍ Scribed by Y. Jaccard; A. Cretton; E.J. Williams; J.-P. Locquet; E. Mächler; T. Schneider; Ø. Fischer; P. Martinoli

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