Stresses in Thin Ni-Films with Uniaxial Anisotropy
✍ Scribed by B. Gontarz; H. Ratajczak; P. Šuda
- Publisher
- John Wiley and Sons
- Year
- 1966
- Tongue
- English
- Weight
- 187 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0370-1972
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Samples consisting of 75 nm Ni films deposited on Si substrates were bent mechanically and irradiated with 200 keV Xe-ions at a dose of 4 • 10 14 ions/cm 2 . Magneto-optical Kerr effect, Rutherford backscattering spectrometry and X-ray diffraction were used to investigate the changes in the magnetic
## Abstract Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based o