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Stresses in Ru/PbZr0.4Ti0.6O3/Ru thin film stacks for integrated ferroelectric capacitors

✍ Scribed by G.A.C.M. Spierings; J.M. Breed; M.J.E. Ulenaers; P.J. van Veldhoven; P.K. Larsen


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
294 KB
Volume
29
Category
Article
ISSN
0167-9317

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