Stress relaxation in thin film/substrate systems by grain boundary diffusion: a discrete dislocation framework

✍ Scribed by Ayas, C; Van der Giessen, E

• Book ID: 120539923
• Publisher: Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 408 KB
• Volume: 17
• Category: Article
• ISSN: 0965-0393
• DOI: 10.1088/0965-0393/17/6/064007