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Stress relaxation in highly strained InAs/GaAs structures as studied by finite element analysis and transmission electron microscopy

✍ Scribed by Benabbas, T.; Francois, P.; Androussi, Y.; Lefebvre, A.


Book ID
115478229
Publisher
American Institute of Physics
Year
1996
Tongue
English
Weight
379 KB
Volume
80
Category
Article
ISSN
0021-8979

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