Stress induced corrosion of wire micro-joints in microelectronics—A quantitative model

✍ Scribed by Andrew H. Rawicz

• Book ID: 103286065
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 318 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90011-6