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Stress-induced anisotropy in LPE grown Ni(Fe,Al)2O4 films

✍ Scribed by P.J.M. van der Straten; R. Metselaar


Book ID
113185503
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
596 KB
Volume
13
Category
Article
ISSN
0025-5408

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Samples consisting of 75 nm Ni films deposited on Si substrates were bent mechanically and irradiated with 200 keV Xe-ions at a dose of 4 β€’ 10 14 ions/cm 2 . Magneto-optical Kerr effect, Rutherford backscattering spectrometry and X-ray diffraction were used to investigate the changes in the magnetic