𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Stress field simulation of the specimen with multi-layer phase structure

✍ Scribed by Ligang Liu; Qiang Li; Bo Liao; Xuejun Ren; Qingxiang Yang


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
638 KB
Volume
435-436
Category
Article
ISSN
0921-5093

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Application of ion-beam etching techniqu
✍ Yonehara, Katsuhisa ;Baba, Norio ;Kanaya, Koichi πŸ“‚ Article πŸ“… 1989 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 801 KB

The term "etching," in electron microscopy, refers to the removal of specimen surface layers and includes chemical, electrolytic, and ion-beam methods. The ion-beam etching process is used to remove layers of a target material by bombarding it with ionized gas molecules. Recently, the method has bee