Stress effect in sputtered metal-semiconductor junctions: O Growth et al, Phys Stat Sol (a), 20 (2), 1973, 589–594

• Book ID: 103458186
• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 168 KB
• Volume: 25
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(75)91207-5