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Stress distributions around an interference-fit pin connection in a plated through hole: Ram P. Goel and Edward Guancial. IEEE Trans. Components, Hybrids Mfng Technol. CHMT-3 (3), 392 (September 1980)


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
123 KB
Volume
21
Category
Article
ISSN
0026-2714

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