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Stress at the Si—SiO2interface and its relationship to interface states

✍ Scribed by Lane, C.H.

Book ID: 114589480
Publisher: IEEE
Year: 1968
Tongue: English
Weight: 829 KB
Volume: 15
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1968.16552

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