𝔖 Bobbio Scriptorium

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Stress analyses by X-ray diffraction in duplex systems: Metallic substrate + oxide : Lebrun, J.L.; Huntz, A.M.; Beranger, G.; Aubry, A.; Zhao, J.G. Residual stresses in science and technology. Proceedings of the international conference, Garmisch-Partenkurchen (FRG), Oct. 1986. pp. 135–143. Deutsche Gesellschaft fur metallkunde, 1059 pp. (1987)

Publisher: Elsevier Science
Year: 1989
Weight: 162 KB
Volume: 22
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(89)91187-5

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