Strength degradation and lifetime prediction of HP-Si3N4/TiC under static load at 1200°C

✍ Scribed by Y Bao; Z Jin; L Sun

• Book ID: 117356015
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 403 KB
• Volume: 45
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/s0167-577x(00)00069-0