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Streamlined ellipsometry procedure for characterizing physical aging rates of thin polymer films

✍ Scribed by Elizabeth A. Baker; Perla Rittigstein; John M. Torkelson; Connie B. Roth

Book ID: 105339269
Publisher: John Wiley and Sons
Year: 2009
Tongue: English
Weight: 274 KB
Volume: 47
Category: Article
ISSN: 0887-6266
DOI: 10.1002/polb.21861

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