Stray Magnetic Field Measurements for Shadow Mask Holes and Their Effects on the Electron Trajectory

✍ Scribed by Suzuki, H.; Haga, A.; Nasuno, H.; Fujimura, T.; Yamane, K.

• Book ID: 117920108
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 1993
• Weight: 827 KB
• Volume: 8
• Category: Article
• ISSN: 0882-4959
• DOI: 10.1109/tjmj.1993.4565580