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strained thin films probed by x-ray absorption spectroscopy

✍ Scribed by Souza-Neto, Narcizo M.; Ramos, Aline Y.; Tolentino, Hélio C. N.; Favre-Nicolin, Emmanuel; Ranno, Laurent

Book ID: 127348884
Publisher: The American Physical Society
Year: 2004
Tongue: English
Weight: 151 KB
Volume: 70
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.70.174451

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