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Strained state of Ge(Si) islands on Si: Finite element calculations and comparison to convergent beam electron-diffraction measurements

✍ Scribed by Christiansen, S.; Albrecht, M.; Strunk, H. P.; Maier, H. J.


Book ID
120216060
Publisher
American Institute of Physics
Year
1994
Tongue
English
Weight
713 KB
Volume
64
Category
Article
ISSN
0003-6951

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