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Strain relaxation and interfacial stability in III–V semiconductor strained-layer heteroepitaxy: atomistic and continuum modeling and comparisons with experiments

✍ Scribed by Dimitrios Maroudas; Luis A. Zepeda-Ruiz; Rodney I. Pelzel; Brett Z. Nosho; W. Henry Weinberg


Book ID
117626650
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
428 KB
Volume
23
Category
Article
ISSN
0927-0256

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