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Strain rate sensitivity and activation volume of Cu/Ni metallic multilayer thin films measured via micropillar compression

✍ Scribed by Carpenter, J. S.; Misra, A.; Uchic, M. D.; Anderson, P. M.


Book ID
121814039
Publisher
American Institute of Physics
Year
2012
Tongue
English
Weight
914 KB
Volume
101
Category
Article
ISSN
0003-6951

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