✦ LIBER ✦
Strain-rate sensitivity, activation volume and mobile dislocations exhaustion rate in nanocrystalline Cu–11.1at%Al alloy with low stacking fault energy
✍ Scribed by Huang, C.X.; Hu, W.P.; Wang, Q.Y.
- Book ID
- 124144496
- Publisher
- Elsevier Science
- Year
- 2014
- Tongue
- English
- Weight
- 785 KB
- Volume
- 611
- Category
- Article
- ISSN
- 0921-5093
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