✦ LIBER ✦
Strain in ultrathin epitaxial films of Ge/Si(100) measured by ion scattering and channeling
✍ Scribed by Feldman, L.; Bevk, J.; Davidson, B.; Gossmann, H.-J.; Mannaerts, J.
- Book ID
- 111678077
- Publisher
- The American Physical Society
- Year
- 1987
- Tongue
- English
- Weight
- 188 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0031-9007
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