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Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations

✍ Scribed by Bonera, E.; Pezzoli, F.; Picco, A.; Vastola, G.; Stoffel, M.; Grilli, E.; Guzzi, M.; Rastelli, A.; Schmidt, O. G.; Miglio, L.

Book ID: 121275862
Publisher: The American Physical Society
Year: 2009
Tongue: English
Weight: 271 KB
Volume: 79
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.79.075321

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