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Strain field of InAs QDs on GaAs (001) substrate surface: characterization by synchrotron X-ray Renninger scanning

✍ Scribed by S.L. Morelhão; L.H. Avanci; R. Freitas; A.A. Quivy


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
153 KB
Volume
36
Category
Article
ISSN
0026-2692

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