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Strain characterization of Ge1−xSix and heavily B-doped Ge layers on Ge(001) by two-dimensional reciprocal space mapping

✍ Scribed by H.H. Radamson; K.B. Joelsson; W.-X. Ni; J. Birch; J.-E. Sundgren; L. Hultman; G.V. Hansson


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
487 KB
Volume
167
Category
Article
ISSN
0022-0248

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