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Strain and stress build-up in He-implanted UO2single crystals: an X-ray diffraction study

✍ Scribed by Aurélien Debelle; Alexandre Boulle; Frédérico Garrido; Lionel Thomé


Publisher
Springer
Year
2011
Tongue
English
Weight
345 KB
Volume
46
Category
Article
ISSN
0022-2461

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