✦ LIBER ✦
Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction
✍ Scribed by Hong-Quan Zhao; Li-Juan Yu; Yong-Zhen Huang; Yu-Tian Wang
- Book ID
- 108215380
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 192 KB
- Volume
- 133
- Category
- Article
- ISSN
- 0921-5107
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