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Stoichiometric Study of the Dielectric and Magnetic Properties in Charge Frustrated System LuFe 2 O 4

✍ Scribed by Michiuchi, Takamasa; Yokota, Yusuke; Komatsu, Takuma; Hayakawa, Hironori; Kuroda, Tomoko; Maeda, Daisuke; Matsuo, Yoji; Mori, Shigeo; Yoshii, Kenji; Hanasaki, Noriaki; Kambe, Takashi; Ikeda, Naoshi

Book ID: 118196691
Publisher: Taylor and Francis Group
Year: 2009
Tongue: English
Weight: 650 KB
Volume: 378
Category: Article
ISSN: 0015-0193
DOI: 10.1080/00150190902859187

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