Stoichiometric effects on the properties of copper based chalcopyrite I–III–VI2 semiconductor thin films

✍ Scribed by Joseph J. Loferski

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 572 KB
• Volume: 13
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/0921-5107(92)90127-u