Stochastic models for evaluating probability of system failure due to human error : Balbir S. Dhillon. Microelectron. Reliab. 24 (5) 921 (1984)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 119 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90578-0