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Stochastic modelling of crack initiation and short-crack growth under creep and creep-fatigue conditions. (Report): Kitamura, T., Ghosn, L.J. and Ohtani, R. NASA Tech. Memo TM-101358 1989, 18 pp


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
167 KB
Volume
11
Category
Article
ISSN
0142-1123

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