Stochastic model in microwave propagation
β Scribed by A. Ranfagni; D. Mugnai
- Book ID
- 113851744
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 258 KB
- Volume
- 376
- Category
- Article
- ISSN
- 0375-9601
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π SIMILAR VOLUMES
grated gain model at a thickness of 75 A, the solid line shows logarithmic dependence, and the dashed line shows the dependence of degree 0.541. The figure shows that the logarithmic model most exactly describes the calculation diagram. An analysis of the quasi-Fermi level versus electron concentr
stochastic model for fatigue crack propagation is proposed in consideration of random propagation resistance. It is based on Paris-Erdogan's propagation law of fatigue crack. By adding Gaussian white noise to the propagation resistance, the propagation law is randomized. A stochastic differential eq