𝔖 Bobbio Scriptorium
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STM study of Ar+-induced defects produced by near-threshold energy collision

✍ Scribed by J.R. Hahn; H. Kang


Book ID
116068886
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
415 KB
Volume
357-358
Category
Article
ISSN
0039-6028

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