SThM Temperature Mapping and Nonlinear Thermal Resistance Evolution With Bias on AlGaN/GaN HEMT Devices

✍ Scribed by Raphal Aubry; Jean-Claude Jacquet; J. Weaver; Olivier Durand; P. Dobson; G. Mills; Marie-Antoinette di Forte-Poisson; Simone Cassette; Sylvain-Laurent Delage

• Book ID: 114618617
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 790 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.890380