Step-stress failure rate models for electronic components : J. S. Bora. Microelectron. & Reliab.13, 259 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 135 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90492-8