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Step-edge junction fabrication by a Si/YBCO reactive patterning technique

โœ Scribed by C. Camerlingo; H. Huang; B. Ruggiero; M. Russo; E. Sarnelli; G. Testa; L. Correra; S. Guerri; S. Neri; S. Nicoletti; G. Pizzochero; Y. Su


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
362 KB
Volume
232
Category
Article
ISSN
0921-4534

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โœฆ Synopsis


An improved procedure for fabricating step-edge Josephson junctions by YBCO on NdGaO3 substrates is described. It is based on a reactive patterning of the superconducting film geometry by using a SiOx inhibit process. SQUID's have been fabricated following this technique. Preliminary measurements on the transport properties in single junctions and on the magnetic response in DC SQUID's are reported. Promising results have been obtained at T=4.2 K.


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High-T= step-edge junctions have successfully been fabricated on chemically etched MgO substrate steps. Epitaxial thin films of YBa2Cu,0,\_6 have been prepared utilizing an off-axis RF magnetron sputtering method. AFM observations were made to investigate surface morphology of the etched substrate a