STEM (scanning transmission electron microscopy) analysis of femtosecond laser pulse induced damage to bulk silicon

✍ Scribed by E. Coyne; J.P. Magee; P. Mannion; G.M. O’Connor; T.J. Glynn

• Publisher: Springer
• Year: 2005
• Tongue: English
• Weight: 653 KB
• Volume: 81
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-004-2605-2