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STEM-EDS X-ray microanalysis of grain boundary segregations: The influence of electron probe size and grain boundary orientation

✍ Scribed by P. Doig; P.E.J. Flewitt

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 506 KB
Volume: 14
Category: Article
ISSN: 0739-6260
DOI: 10.1016/0047-7206(83)90053-5

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