Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement

✍ Scribed by Stapper, C.H.

• Book ID: 119778282
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 857 KB
• Volume: 10
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.67793