Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions

✍ Scribed by Yu. I. Bogdanov; N. A. Bogdanova; V. L. Dshkhunyan

• Book ID: 110411550
• Publisher: Springer
• Year: 2003
• Tongue: English
• Weight: 83 KB
• Volume: 32
• Category: Article
• ISSN: 1063-7397
• DOI: 10.1023/a:1021813903727